smartctl version 5.38 [powerpc-unknown-linux-gnu] Copyright (C) 2002-8 Bruce Allen Home page is http://smartmontools.sourceforge.net/ Warning! Drive Identity Structure error: invalid SMART checksum. === START OF INFORMATION SECTION === Device Model: @itacha AC25F000ATER04%0 Serial Number: ERG426C4GB62QH Firmware Version: EO4AAD0A User Capacity: 11,305,836,544 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 6 ATA Standard is: ATA/ATAPI-6 T13 1410D revision 3a Local Time is: Fri Jan 1 10:23:49 1904 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled Warning! SMART Attribute Data Structure error: invalid SMART checksum. Warning! SMART Attribute Thresholds Structure error: invalid SMART checksum. === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 645) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 69) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x0003 099 099 054 Pre-fail Always - 131072 2 Throughput_Performance 0x0005 100 100 032 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 117 117 033 Pre-fail Always - 1 4 Start_Stop_Count 0x0012 034 034 000 Old_age Always - 104960 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x0003 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 032 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 052 052 000 Old_age Always - 21156 10 Spin_Retry_Count 0x0013 100 100 052 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 2870 191 G-Sense_Error_Rate 0x0002 100 100 000 Old_age Always - 0 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 177 193 Load_Cycle_Count 0x0012 039 039 000 Old_age Always - 88519 194 Temperature_Celsius 0x0002 129 137 000 Old_age Always - 32 (Lifetime Min/Max 4/52) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 18 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 1 198 Offline_Uncorrectable 0x0000 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0002 192 200 000 Old_age Always - 3777 Warning! SMART ATA Error Log Structure error: invalid SMART checksum. SMART Error Log Version: 1 ATA Error Count: 34 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 34 occurred at disk power-on lifetime: 21164 hours (881 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 07 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000007 = 7 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 00 00 00 e0 00 00:01:59.300 READ DMA EXT 25 00 08 00 00 00 e0 00 00:01:59.300 READ DMA EXT 10 00 3f 00 00 00 e0 00 00:01:59.300 RECALIBRATE [OBS-4] 25 00 08 00 00 00 e0 00 00:01:59.300 READ DMA EXT 25 00 08 00 00 00 e0 00 00:01:59.300 READ DMA EXT Error 33 occurred at disk power-on lifetime: 21164 hours (881 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 07 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000007 = 7 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 00 00 00 e0 00 00:01:59.300 READ DMA EXT 10 00 3f 00 00 00 e0 00 00:01:59.300 RECALIBRATE [OBS-4] 25 00 08 00 00 00 e0 00 00:01:59.300 READ DMA EXT 25 00 08 00 00 00 e0 00 00:01:59.300 READ DMA EXT e7 03 40 07 00 00 e0 04 00:01:59.200 FLUSH CACHE Error 32 occurred at disk power-on lifetime: 21164 hours (881 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 07 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000007 = 7 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 00 00 00 e0 00 00:01:59.300 READ DMA EXT 25 00 08 00 00 00 e0 00 00:01:59.300 READ DMA EXT e7 03 40 07 00 00 e0 04 00:01:59.200 FLUSH CACHE e7 03 40 07 00 00 e0 02 00:01:59.200 FLUSH CACHE 25 00 08 00 00 00 e0 00 00:01:59.200 READ DMA EXT Error 31 occurred at disk power-on lifetime: 21164 hours (881 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 07 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000007 = 7 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 00 00 00 e0 00 00:01:59.300 READ DMA EXT e7 03 40 07 00 00 e0 04 00:01:59.200 FLUSH CACHE e7 03 40 07 00 00 e0 02 00:01:59.200 FLUSH CACHE 25 00 08 00 00 00 e0 00 00:01:59.200 READ DMA EXT 25 00 08 00 00 00 e0 00 00:01:59.100 READ DMA EXT Error 30 occurred at disk power-on lifetime: 21164 hours (881 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 07 00 00 e0 Error: ICRC, ABRT at LBA = 0x00000007 = 7 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 00 00 00 e0 00 00:01:59.200 READ DMA EXT 25 00 08 00 00 00 e0 00 00:01:59.100 READ DMA EXT 10 00 3f 00 00 00 e0 00 00:01:59.100 RECALIBRATE [OBS-4] 25 00 08 00 00 00 e0 00 00:01:59.100 READ DMA EXT 25 00 08 00 00 00 e0 00 00:01:59.100 READ DMA EXT Warning! SMART Self-Test Log Structure error: invalid SMART checksum. SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Aborted by host 10% 13890 - Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.